Simultaneous extraction of charge density dependent mobility and variable contact resistance from thin film transistors

Riccardo Di Pietro, Deepak Venkateshvaran, Andreas Klug, Emil List-Kratochvil, Antonio Facchetti, Henning Sirringhaus, Dieter Neher

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)193501-1-193501-6
JournalApplied Physics Letters
Volume104
DOIs
Publication statusPublished - 2014

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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