Simulation of radiated emission during the design phase based on scattering parameter measurement

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Abstract

As the electromagnetic compatibility (EMC) of IC products takes on greater significance for competitiveness, IC manufacturers are increasingly interested in evaluating the EMC performance of their products as soon as during the very first design phase without the need of prototypes. There are a number of approaches to predict radiated emissions of automotive components as defined in the CISPR25 standard. However, it can be concluded that none of them are suitable for continuous use by the circuit designer itself because they either need a manufactured prototype and a lab engineer, or lots of simulation time and resources. The designer is normally no EMC expert and does not want to deal with additional, complex simulation tools. This paper presents the generation and use of a simulation model which can easily be implemented in the design environment (e.g. Cadence Virtuoso) used by the designer and does not notably increase the simulation time. The transient data is post-processed with a Matlab script emulating an EMI test receiver.

LanguageEnglish
Title of host publicationEMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits
PublisherInstitute of Electrical and Electronics Engineers
Pages228-231
Number of pages4
ISBN (Electronic)9781467378963
DOIs
StatusPublished - 15 Dec 2015
Event10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2015 - Edinburgh, United Kingdom
Duration: 10 Nov 201513 Nov 2015

Conference

Conference10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2015
CountryUnited Kingdom
CityEdinburgh
Period10/11/1513/11/15

Fingerprint

Scattering parameters
Electromagnetic compatibility
electromagnetic compatibility
scattering
simulation
prototypes
products
engineers
Engineers
resources
Networks (circuits)
receivers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

Fields of Expertise

  • Information, Communication & Computing

Cite this

Hackl, H., Winkler, G., & Deutschmann, B. (2015). Simulation of radiated emission during the design phase based on scattering parameter measurement. In EMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (pp. 228-231). [7358362] Institute of Electrical and Electronics Engineers. DOI: 10.1109/EMCCompo.2015.7358362

Simulation of radiated emission during the design phase based on scattering parameter measurement. / Hackl, Herbert; Winkler, Gunter; Deutschmann, Bernd.

EMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits. Institute of Electrical and Electronics Engineers, 2015. p. 228-231 7358362.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Hackl, H, Winkler, G & Deutschmann, B 2015, Simulation of radiated emission during the design phase based on scattering parameter measurement. in EMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits., 7358362, Institute of Electrical and Electronics Engineers, pp. 228-231, 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2015, Edinburgh, United Kingdom, 10/11/15. DOI: 10.1109/EMCCompo.2015.7358362
Hackl H, Winkler G, Deutschmann B. Simulation of radiated emission during the design phase based on scattering parameter measurement. In EMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits. Institute of Electrical and Electronics Engineers. 2015. p. 228-231. 7358362. Available from, DOI: 10.1109/EMCCompo.2015.7358362
Hackl, Herbert ; Winkler, Gunter ; Deutschmann, Bernd. / Simulation of radiated emission during the design phase based on scattering parameter measurement. EMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits. Institute of Electrical and Electronics Engineers, 2015. pp. 228-231
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