Simulation challenges in system level electrostatic discharge modeling

David Pommerenke, Jun Fan, Jim Drewniak

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

Simulation of system level electrostatic discharge (ESD) is challenging due to the complexity of electronic systems, missing soft failure models for ICs and the modeling of arcing. This paper details these difficulties and points at examples of successful solutions for modeling ESD generators in SPICE and full wave, modeling of arc behavior, and simulation of ESD into products causing soft-failures.

Original languageEnglish
Title of host publication2016 IEEE/ACES International Conference on Wireless Information Technology, ICWITS 2016 and System and Applied Computational Electromagnetics, ACES 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9781509012596
DOIs
Publication statusPublished - 4 May 2016
Externally publishedYes
EventIEEE/ACES International Conference on Wireless Information Technology, ICWITS 2016 and System and Applied Computational Electromagnetics, ACES 2016 - Honolulu, United States
Duration: 13 Mar 201617 Mar 2016

Publication series

Name2016 IEEE/ACES International Conference on Wireless Information Technology, ICWITS 2016 and System and Applied Computational Electromagnetics, ACES 2016 - Proceedings

Conference

ConferenceIEEE/ACES International Conference on Wireless Information Technology, ICWITS 2016 and System and Applied Computational Electromagnetics, ACES 2016
Country/TerritoryUnited States
CityHonolulu
Period13/03/1617/03/16

Keywords

  • ESD
  • FDTD
  • numerical simulation
  • spark resistance
  • spice

ASJC Scopus subject areas

  • Computational Mathematics
  • Signal Processing
  • Instrumentation
  • Computer Networks and Communications

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