Serial block-face scanning electron microscopy (SBEM) of soft materials for 3D reconstruction - How to get contrast

Armin Zankel, Claudia Mayrhofer, Herbert Reingruber, S. Wernitznig, G. Leitinger, Peter Pölt

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMicroscopy Conference
Publisher.
Pages418-419
Publication statusPublished - 2013
EventMicroscopy Conference - Regensburg, Germany
Duration: 25 Aug 201330 Aug 2013

Conference

ConferenceMicroscopy Conference
Abbreviated titleMC
CountryGermany
CityRegensburg
Period25/08/1330/08/13

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Serial block-face scanning electron microscopy (SBEM) of soft materials for 3D reconstruction - How to get contrast. / Zankel, Armin; Mayrhofer, Claudia; Reingruber, Herbert; Wernitznig, S.; Leitinger, G.; Pölt, Peter.

Microscopy Conference. ., 2013. p. 418-419.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Zankel, A, Mayrhofer, C, Reingruber, H, Wernitznig, S, Leitinger, G & Pölt, P 2013, Serial block-face scanning electron microscopy (SBEM) of soft materials for 3D reconstruction - How to get contrast. in Microscopy Conference. ., pp. 418-419, Microscopy Conference, Regensburg, Germany, 25/08/13.
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AU - Leitinger, G.

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BT - Microscopy Conference

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