Serial block-face scanning electron microscopy (SBEM) of soft materials for 3D reconstruction - How to get contrast

Armin Zankel, Claudia Mayrhofer, Herbert Reingruber, S. Wernitznig, G. Leitinger, Peter Pölt

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMicroscopy Conference
Publisher.
Pages418-419
Publication statusPublished - 2013
EventMicroscopy Conference - Regensburg, Germany
Duration: 25 Aug 201330 Aug 2013

Conference

ConferenceMicroscopy Conference
Abbreviated titleMC
CountryGermany
CityRegensburg
Period25/08/1330/08/13

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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