Serial block face scanning electron microscopy for three dimensional analysis in materials science

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2012
EventEuropean Microscopy Congress - Manchester
Duration: 16 Sept 201221 Sept 2012

Conference

ConferenceEuropean Microscopy Congress
CityManchester
Period16/09/1221/09/12

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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