Serial block face scanning electron microscopy for three dimensional analysis in materials science

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2012
EventEuropean Microscopy Congress - Manchester
Duration: 16 Sep 201221 Sep 2012

Conference

ConferenceEuropean Microscopy Congress
CityManchester
Period16/09/1221/09/12

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Zankel, A., Reingruber, H., Schröttner, H., & Pölt, P. (2012). Serial block face scanning electron microscopy for three dimensional analysis in materials science. Poster session presented at European Microscopy Congress, Manchester, .