SE measurements with a TEM cell to study gasket reliability

Parisa Faraji, James L. Drewniak, Douglas S. McBain, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper a near-field Shielding Effectiveness measurement approach for highly conductive gaskets while maintaining the interface is presented. SE measurements of initial gasket performance along with reliability data in hostile environments are vital for predicting a gasket performance in conjunction with specific joint surfaces. The TEM cell method reported herein offers an analytical approach for studying aging and reliability of gaskets and metal contact interfaces in place. Preserving the gasket-metal interface is critical throughout the testing and aging steps, which is an important advantage of this methodology.

Original languageEnglish
Title of host publicationProceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013
Pages462-465
Number of pages4
DOIs
Publication statusPublished - 1 Dec 2013
Externally publishedYes
Event2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013 - Denver, CO, United States
Duration: 5 Aug 20139 Aug 2013

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Conference

Conference2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013
CountryUnited States
CityDenver, CO
Period5/08/139/08/13

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Faraji, P., Drewniak, J. L., McBain, D. S., & Pommerenke, D. (2013). SE measurements with a TEM cell to study gasket reliability. In Proceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013 (pp. 462-465). [6670457] (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2013.6670457