@inproceedings{7044fdd2268c4e3a970c94bb9780c9ab,
title = "Scenarios of ESD discharges to USB connectors",
abstract = "Different real world scenarios which may cause stress voltages on USB connected devices are investigated. This study identifies ESD discharge scenarios and their respective current and voltage levels, stress duration and the rise times for different USB cable shield types.",
author = "Shubhankar Marathe and Pengyu Wei and Sun Ze and Li Guan and David Pommerenke",
year = "2017",
month = oct,
day = "18",
language = "English",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017",
note = "39th Annual Electrical Overstress/Electrostatic Discharge Symposium : EOS/ESD 2017 ; Conference date: 10-09-2017 Through 14-09-2017",
}