Scenarios of ESD discharges to USB connectors

Shubhankar Marathe, Pengyu Wei, Sun Ze, Li Guan, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

Different real world scenarios which may cause stress voltages on USB connected devices are investigated. This study identifies ESD discharge scenarios and their respective current and voltage levels, stress duration and the rise times for different USB cable shield types.

Original languageEnglish
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017
PublisherESD Association
ISBN (Electronic)1585372935
Publication statusPublished - 18 Oct 2017
Externally publishedYes
Event39th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2017 - Tucson, United States
Duration: 10 Sep 201714 Sep 2017

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159

Conference

Conference39th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2017
Country/TerritoryUnited States
CityTucson
Period10/09/1714/09/17

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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