Robust Spot Fitting for Genetic Spot Array Images

Horng-Yang Chen, Norbert Brändle, Horst Bischof, Hilmar Lapp

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the Czech Pattern Recognition Workshop 2000
PublisherCzech Pattern Recognition Society
Pages35-44
Publication statusPublished - 2000

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