Robust Spot Fitting for Genetic Spot Array Images

Horng-Yang Chen, Norbert Brändle, Horst Bischof, Hilmar Lapp

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of the Czech Pattern Recognition Workshop 2000
PublisherCzech Pattern Recognition Society
Pages35-44
Publication statusPublished - 2000

Cite this

Chen, H-Y., Brändle, N., Bischof, H., & Lapp, H. (2000). Robust Spot Fitting for Genetic Spot Array Images. In Proceedings of the Czech Pattern Recognition Workshop 2000 (pp. 35-44). Czech Pattern Recognition Society.

Robust Spot Fitting for Genetic Spot Array Images. / Chen, Horng-Yang; Brändle, Norbert; Bischof, Horst; Lapp, Hilmar.

Proceedings of the Czech Pattern Recognition Workshop 2000. Czech Pattern Recognition Society, 2000. p. 35-44.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Chen, H-Y, Brändle, N, Bischof, H & Lapp, H 2000, Robust Spot Fitting for Genetic Spot Array Images. in Proceedings of the Czech Pattern Recognition Workshop 2000. Czech Pattern Recognition Society, pp. 35-44.
Chen H-Y, Brändle N, Bischof H, Lapp H. Robust Spot Fitting for Genetic Spot Array Images. In Proceedings of the Czech Pattern Recognition Workshop 2000. Czech Pattern Recognition Society. 2000. p. 35-44
Chen, Horng-Yang ; Brändle, Norbert ; Bischof, Horst ; Lapp, Hilmar. / Robust Spot Fitting for Genetic Spot Array Images. Proceedings of the Czech Pattern Recognition Workshop 2000. Czech Pattern Recognition Society, 2000. pp. 35-44
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