Robust Spot Fitting for Genetic Spot Array Images

H-Y. Chen, Norbert Brändle, Horst Bischof, H. Lapp

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings / 2000 International Conference on Image Processing ; Vol. 3
Place of PublicationPiscataway, NJ
PublisherIEEE Operations Center
Pages412-415
ISBN (Print)0-7803-6297-7
Publication statusPublished - 2000
EventInternational Conference on Image Processing - Vancouver, Canada
Duration: 10 Sep 200013 Sep 2000

Conference

ConferenceInternational Conference on Image Processing
CountryCanada
CityVancouver
Period10/09/0013/09/00

Cite this

Chen, H-Y., Brändle, N., Bischof, H., & Lapp, H. (2000). Robust Spot Fitting for Genetic Spot Array Images. In Proceedings / 2000 International Conference on Image Processing ; Vol. 3 (pp. 412-415). Piscataway, NJ: IEEE Operations Center.

Robust Spot Fitting for Genetic Spot Array Images. / Chen, H-Y.; Brändle, Norbert; Bischof, Horst; Lapp, H.

Proceedings / 2000 International Conference on Image Processing ; Vol. 3. Piscataway, NJ : IEEE Operations Center, 2000. p. 412-415.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Chen, H-Y, Brändle, N, Bischof, H & Lapp, H 2000, Robust Spot Fitting for Genetic Spot Array Images. in Proceedings / 2000 International Conference on Image Processing ; Vol. 3. IEEE Operations Center, Piscataway, NJ, pp. 412-415, International Conference on Image Processing, Vancouver, Canada, 10/09/00.
Chen H-Y, Brändle N, Bischof H, Lapp H. Robust Spot Fitting for Genetic Spot Array Images. In Proceedings / 2000 International Conference on Image Processing ; Vol. 3. Piscataway, NJ: IEEE Operations Center. 2000. p. 412-415
Chen, H-Y. ; Brändle, Norbert ; Bischof, Horst ; Lapp, H. / Robust Spot Fitting for Genetic Spot Array Images. Proceedings / 2000 International Conference on Image Processing ; Vol. 3. Piscataway, NJ : IEEE Operations Center, 2000. pp. 412-415
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