Robust Spot Fitting for Genetic Spot Array Images

H-Y. Chen, Norbert Brändle, Horst Bischof, H. Lapp

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings / 2000 International Conference on Image Processing ; Vol. 3
Place of PublicationPiscataway, NJ
PublisherIEEE Operations Center
Pages412-415
ISBN (Print)0-7803-6297-7
Publication statusPublished - 2000
EventInternational Conference on Image Processing - Vancouver, Canada
Duration: 10 Sep 200013 Sep 2000

Conference

ConferenceInternational Conference on Image Processing
CountryCanada
CityVancouver
Period10/09/0013/09/00

Cite this