Projects per year
Abstract
The Through-Reflect-Line (TRL) and multiline-TRL (mTRL) calibration are well known for accurate parameterization of the systematic errors of a vector network analyzer (VNA). When applying this approach to calibration/deembedding in connection with PCBs tested on a probe station, the imperfections of the RF probe to PCB transitions add to the overall measurement uncertainty. These measurement imperfections may result in an incorrect output of the mTRL algorithm due to faulty measurements. To mitigate this situation, an implementation of the mTRL calibration is presented which, on the one hand, focuses on a robust implementation able to cope with mentioned measurement conditions and, on the other hand, tags possible improper measurements.
Original language | English |
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Title of host publication | 97th ARFTG Microwave Measurement Conference |
Subtitle of host publication | Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021 |
Publisher | IEEE Publications |
Pages | 1-4 |
Number of pages | 4 |
ISBN (Electronic) | 9780738112480 |
ISBN (Print) | 978-1-6654-4794-2 |
DOIs | |
Publication status | Published - 25 Jun 2021 |
Event | 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity: ARFTG 2021 - Virtual, Atlanta, United States Duration: 25 Jun 2021 → 25 Jun 2021 |
Publication series
Name | 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021 |
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Conference
Conference | 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity |
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Abbreviated title | ARFTG 2021 |
Country/Territory | United States |
City | Virtual, Atlanta |
Period | 25/06/21 → 25/06/21 |
Keywords
- Radio frequency
- Uncertainty
- Systematics
- Measurement uncertainty
- Network analyzers
- Calibration
- Propagation constant
- MTRL
- S-parameters
- VNA
- Planar substrates
- PCB
- On-wafer
ASJC Scopus subject areas
- Instrumentation
- Electrical and Electronic Engineering
- Computer Networks and Communications
Fields of Expertise
- Information, Communication & Computing
Treatment code (Nähere Zuordnung)
- Experimental
Projects
- 2 Active
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CD-Laboratory for Technology guided electronic component design and characterization
Bösch, W., Hatab, Z., Gadringer, M. E., Takahashi, H., Maier, C., Sarbandi Farahani, H., Pauser, C., Paulitsch, H., Rezaee, B. & Fuchs, M.
1/11/20 → 31/10/27
Project: Research project
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Microwave and mm-wave measurement techniques
Amschl, D., Gruber, A., Gadringer, M. E., Auinger, B., Paulitsch, H., Sattler, S., Bösch, W., Schreiber, H. & Freidl, P. F.
1/01/10 → …
Project: Research area
Prizes
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The Automatic RF Techniques Group - Best Oral Presentation Award
Gadringer, Michael Ernst (Recipient), 24 Jun 2022
Prize: Prizes / Medals / Awards
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