Robust Local Features and their Application in Self-Calibration and Object Recognition on Embedded Systems

Clemens Arth, Christian Leistner, Horst Bischof

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of Workshop on Embedded Computer Vision
PublisherInstitute of Electrical and Electronics Engineers
Pages01-02
Publication statusPublished - 2007
EventConference on Computer Vision and Pattern Recognition - New York, United States
Duration: 16 Jun 200622 Jun 2006

Conference

ConferenceConference on Computer Vision and Pattern Recognition
CountryUnited States
CityNew York
Period16/06/0622/06/06

Treatment code (Nähere Zuordnung)

  • Application

Cite this

Arth, C., Leistner, C., & Bischof, H. (2007). Robust Local Features and their Application in Self-Calibration and Object Recognition on Embedded Systems. In Proceedings of Workshop on Embedded Computer Vision (pp. 01-02). Institute of Electrical and Electronics Engineers.