Robust high precision 2d optical range sensor

Markus Brandner, Thomas Thurner

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Original languageEnglish
    Title of host publicationOptical measurement systems for industrial inspection IV
    EditorsWolfgang Osten
    Place of PublicationBellingham, Wash.
    PublisherSPIE
    Pages327-335
    Volume5856
    ISBN (Print)0-8194-5856-2
    Publication statusPublished - 2005
    EventSPIE International Symposium Optical Metrology - München, Germany
    Duration: 13 Jun 200517 Jun 2005

    Publication series

    NameProceedings of SPIE
    PublisherSPIE

    Conference

    ConferenceSPIE International Symposium Optical Metrology
    CountryGermany
    CityMünchen
    Period13/06/0517/06/05

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