Robust high precision 2d optical range sensor

Markus Brandner, Thomas Thurner

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationOptical measurement systems for industrial inspection IV
EditorsWolfgang Osten
Place of PublicationBellingham, Wash.
PublisherSPIE
Pages327-335
Volume5856
ISBN (Print)0-8194-5856-2
Publication statusPublished - 2005
EventSPIE International Symposium Optical Metrology - München, Germany
Duration: 13 Jun 200517 Jun 2005

Publication series

NameProceedings of SPIE
PublisherSPIE

Conference

ConferenceSPIE International Symposium Optical Metrology
CountryGermany
CityMünchen
Period13/06/0517/06/05

Cite this

Brandner, M., & Thurner, T. (2005). Robust high precision 2d optical range sensor. In W. Osten (Ed.), Optical measurement systems for industrial inspection IV (Vol. 5856, pp. 327-335). (Proceedings of SPIE). Bellingham, Wash.: SPIE.

Robust high precision 2d optical range sensor. / Brandner, Markus; Thurner, Thomas.

Optical measurement systems for industrial inspection IV. ed. / Wolfgang Osten. Vol. 5856 Bellingham, Wash. : SPIE, 2005. p. 327-335 (Proceedings of SPIE).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Brandner, M & Thurner, T 2005, Robust high precision 2d optical range sensor. in W Osten (ed.), Optical measurement systems for industrial inspection IV. vol. 5856, Proceedings of SPIE, SPIE, Bellingham, Wash., pp. 327-335, SPIE International Symposium Optical Metrology, München, Germany, 13/06/05.
Brandner M, Thurner T. Robust high precision 2d optical range sensor. In Osten W, editor, Optical measurement systems for industrial inspection IV. Vol. 5856. Bellingham, Wash.: SPIE. 2005. p. 327-335. (Proceedings of SPIE).
Brandner, Markus ; Thurner, Thomas. / Robust high precision 2d optical range sensor. Optical measurement systems for industrial inspection IV. editor / Wolfgang Osten. Vol. 5856 Bellingham, Wash. : SPIE, 2005. pp. 327-335 (Proceedings of SPIE).
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