Robust high precision 2d optical range sensor

Markus Brandner, Thomas Thurner

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Optical measurement systems for industrial inspection IV
Editors	Wolfgang Osten
Place of Publication	Bellingham, Wash.
Publisher	SPIE
Pages	327-335
Volume	5856
ISBN (Print)	0-8194-5856-2
Publication status	Published - 2005
Event	SPIE International Symposium Optical Metrology - München, Germany Duration: 13 Jun 2005 → 17 Jun 2005

Name	Proceedings of SPIE
Publisher	SPIE

Conference	SPIE International Symposium Optical Metrology
Country/Territory	Germany
City	München
Period	13/06/05 → 17/06/05

Cite this

@inproceedings{e9359e05f8364c4c95d8ce35072d3627,

title = "Robust high precision 2d optical range sensor",

author = "Markus Brandner and Thomas Thurner",

year = "2005",

language = "English",

isbn = "0-8194-5856-2",

volume = "5856",

series = "Proceedings of SPIE",

publisher = "SPIE",

pages = "327--335",

editor = "Wolfgang Osten",

booktitle = "Optical measurement systems for industrial inspection IV",

address = "United States",

note = "SPIE International Symposium Optical Metrology ; Conference date: 13-06-2005 Through 17-06-2005",

}

TY - GEN

T1 - Robust high precision 2d optical range sensor

AU - Brandner, Markus

AU - Thurner, Thomas

PY - 2005

Y1 - 2005

M3 - Conference paper

SN - 0-8194-5856-2

VL - 5856

T3 - Proceedings of SPIE

SP - 327

EP - 335

BT - Optical measurement systems for industrial inspection IV

A2 - Osten, Wolfgang

PB - SPIE

CY - Bellingham, Wash.

T2 - SPIE International Symposium Optical Metrology

Y2 - 13 June 2005 through 17 June 2005

ER -