Removing the effects of elastic and thermal scattering from spectrum images in scanning transmission electron microscopy

N.R. Lugg, M.J. Neish, M. Haruta, Gerald Kothleitner, Werner Grogger, Ferdinand Hofer, K. Kimoto, T. Mizoguchi, S.D. Findlay, L.J. Allen

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMicroscopy for Global Challenges
Publisher.
PagesIT-16-P-2955
Publication statusPublished - 2014
EventInternational Microscopy Congress 2014 - Prag Tschechische Republik
Duration: 7 Sep 201412 Sep 2014

Conference

ConferenceInternational Microscopy Congress 2014
CityPrag Tschechische Republik
Period7/09/1412/09/14

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Lugg, N. R., Neish, M. J., Haruta, M., Kothleitner, G., Grogger, W., Hofer, F., ... Allen, L. J. (2014). Removing the effects of elastic and thermal scattering from spectrum images in scanning transmission electron microscopy. In Microscopy for Global Challenges (pp. IT-16-P-2955). ..