Reliable quantification of X-ray spectra using ζ-factors: from standards to geometry

Johanna Kraxner, Lukas Konrad, Daniel Knez, Angelina Orthacker, Sebastian Rauch, Manuel Paller, Gerald Kothleitner, Werner Grogger

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationASEM Workshop Advanced Electron Microscopy
Publisher.
Pages27-27
Publication statusPublished - 2015
Event5th ASEM Workshop - Graz, Austria
Duration: 7 Jun 20158 Jun 2015

Conference

Conference5th ASEM Workshop
CountryAustria
CityGraz
Period7/06/158/06/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

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Cite this

Kraxner, J., Konrad, L., Knez, D., Orthacker, A., Rauch, S., Paller, M., ... Grogger, W. (2015). Reliable quantification of X-ray spectra using ζ-factors: from standards to geometry. In ASEM Workshop Advanced Electron Microscopy (pp. 27-27). ..

Reliable quantification of X-ray spectra using ζ-factors: from standards to geometry. / Kraxner, Johanna; Konrad, Lukas; Knez, Daniel; Orthacker, Angelina; Rauch, Sebastian; Paller, Manuel; Kothleitner, Gerald; Grogger, Werner.

ASEM Workshop Advanced Electron Microscopy. ., 2015. p. 27-27.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Kraxner, J, Konrad, L, Knez, D, Orthacker, A, Rauch, S, Paller, M, Kothleitner, G & Grogger, W 2015, Reliable quantification of X-ray spectra using ζ-factors: from standards to geometry. in ASEM Workshop Advanced Electron Microscopy. ., pp. 27-27, 5th ASEM Workshop, Graz, Austria, 7/06/15.
Kraxner J, Konrad L, Knez D, Orthacker A, Rauch S, Paller M et al. Reliable quantification of X-ray spectra using ζ-factors: from standards to geometry. In ASEM Workshop Advanced Electron Microscopy. . 2015. p. 27-27
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AU - Rauch, Sebastian

AU - Paller, Manuel

AU - Kothleitner, Gerald

AU - Grogger, Werner

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