Real sample features vs. Imaging artifacts in an ESEM

Mario Schmied, Armin Zankel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationMicroscopy by the Bay
Publisher.
PagesP84-P84
ISBN (Print)0-9580408-2-6
Publication statusPublished - 2004
EventAustralian Conference on Microscopy & Microanalysis - Geelong, Australia
Duration: 2 Feb 20046 Feb 2004

Conference

ConferenceAustralian Conference on Microscopy & Microanalysis
CountryAustralia
CityGeelong
Period2/02/046/02/04

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