Real sample features vs. Imaging artifacts in an ESEM

Mario Schmied, Armin Zankel

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMicroscopy by the Bay
Publisher.
PagesP84-P84
ISBN (Print)0-9580408-2-6
Publication statusPublished - 2004
EventAustralian Conference on Microscopy & Microanalysis - Geelong, Australia
Duration: 2 Feb 20046 Feb 2004

Conference

ConferenceAustralian Conference on Microscopy & Microanalysis
CountryAustralia
CityGeelong
Period2/02/046/02/04

Cite this

Schmied, M., & Zankel, A. (2004). Real sample features vs. Imaging artifacts in an ESEM. In Microscopy by the Bay (pp. P84-P84). ..

Real sample features vs. Imaging artifacts in an ESEM. / Schmied, Mario; Zankel, Armin.

Microscopy by the Bay. ., 2004. p. P84-P84.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Schmied, M & Zankel, A 2004, Real sample features vs. Imaging artifacts in an ESEM. in Microscopy by the Bay. ., pp. P84-P84, Australian Conference on Microscopy & Microanalysis, Geelong, Australia, 2/02/04.
Schmied M, Zankel A. Real sample features vs. Imaging artifacts in an ESEM. In Microscopy by the Bay. . 2004. p. P84-P84
Schmied, Mario ; Zankel, Armin. / Real sample features vs. Imaging artifacts in an ESEM. Microscopy by the Bay. ., 2004. pp. P84-P84
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