Ray Tracing: Lessons learned and future challenges

Thomas Schiffer, Wolf-Dietrich Fellner

Research output: Contribution to journalArticleResearch

Original languageEnglish
Pages (from-to)34-37
JournalIEEE potentials
Volume32
Issue number5
DOIs
Publication statusPublished - 2013

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Ray Tracing: Lessons learned and future challenges. / Schiffer, Thomas; Fellner, Wolf-Dietrich.

In: IEEE potentials, Vol. 32, No. 5, 2013, p. 34-37.

Research output: Contribution to journalArticleResearch

Schiffer, Thomas ; Fellner, Wolf-Dietrich. / Ray Tracing: Lessons learned and future challenges. In: IEEE potentials. 2013 ; Vol. 32, No. 5. pp. 34-37.
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