| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 3rd International Conference on Evaluation of Novel Approaches to Software Engineering |
| Publisher | . |
| Pages | 115-122 |
| Publication status | Published - 2008 |
| Event | 3rd International Conference on Evaluation of Novel Approaches to Software Engineering - Funchal, Portugal Duration: 4 May 2008 → 7 May 2008 |
Conference
| Conference | 3rd International Conference on Evaluation of Novel Approaches to Software Engineering |
|---|---|
| Country | Portugal |
| City | Funchal |
| Period | 4/05/08 → 7/05/08 |
Cite this
Weiglhofer, M., & Wotawa, F. (2008). Random vs. Scenario-Based vs. Fault-Based Testing: An Industrial Evaluation of Formal Black-Box Testing Methods. In Proceedings of the 3rd International Conference on Evaluation of Novel Approaches to Software Engineering (pp. 115-122). ..
Random vs. Scenario-Based vs. Fault-Based Testing: An Industrial Evaluation of Formal Black-Box Testing Methods. / Weiglhofer, Martin; Wotawa, Franz.
Proceedings of the 3rd International Conference on Evaluation of Novel Approaches to Software Engineering. ., 2008. p. 115-122.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Weiglhofer, M & Wotawa, F 2008, Random vs. Scenario-Based vs. Fault-Based Testing: An Industrial Evaluation of Formal Black-Box Testing Methods. in Proceedings of the 3rd International Conference on Evaluation of Novel Approaches to Software Engineering. ., pp. 115-122, 3rd International Conference on Evaluation of Novel Approaches to Software Engineering, Funchal, Portugal, 4/05/08.
Weiglhofer M, Wotawa F. Random vs. Scenario-Based vs. Fault-Based Testing: An Industrial Evaluation of Formal Black-Box Testing Methods. In Proceedings of the 3rd International Conference on Evaluation of Novel Approaches to Software Engineering. . 2008. p. 115-122
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