Random vs. Scenario-Based vs. Fault-Based Testing: An Industrial Evaluation of Formal Black-Box Testing Methods

Martin Weiglhofer, Franz Wotawa

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings of the 3rd International Conference on Evaluation of Novel Approaches to Software Engineering
Publisher	.
Pages	115-122
Publication status	Published - 2008
Event	3rd International Conference on Evaluation of Novel Approaches to Software Engineering - Funchal, Portugal Duration: 4 May 2008 → 7 May 2008

Conference	3rd International Conference on Evaluation of Novel Approaches to Software Engineering
Country	Portugal
City	Funchal
Period	4/05/08 → 7/05/08

Cite this

Weiglhofer, M & Wotawa, F 2008, Random vs. Scenario-Based vs. Fault-Based Testing: An Industrial Evaluation of Formal Black-Box Testing Methods. in Proceedings of the 3rd International Conference on Evaluation of Novel Approaches to Software Engineering. ., pp. 115-122, 3rd International Conference on Evaluation of Novel Approaches to Software Engineering, Funchal, Portugal, 4/05/08.

@inproceedings{48082766ea5546969fb5754da38569b7,

title = "Random vs. Scenario-Based vs. Fault-Based Testing: An Industrial Evaluation of Formal Black-Box Testing Methods",

author = "Martin Weiglhofer and Franz Wotawa",

year = "2008",

language = "English",

pages = "115--122",

booktitle = "Proceedings of the 3rd International Conference on Evaluation of Novel Approaches to Software Engineering",

publisher = ".",

}