Abstract
In space-borne, medical and high energy physics applications, the heart of a measurement system is usually an Integrated Circuit (IC). More and more often Application-Specific Integrated Circuits (ASICs) are used instead of from-the-shelve products: ASIC offers lower power consumption than a standard IC or a discrete solution; also, higher measurement precision can be achieved, thanks to small capacitances and high speed, combined with a customized architecture.
This talk focuses on Total Ionizing Dose (TID) effects on integrated circuits (IC) and prospects for their mitigation through Radiation-Hard-by-Design (RHBD) techniques. It also discusses the radiation-hardened ASIC design flow, in particular emphasizing the issues of efficient irradiation tests and characterization of the integrated test structures.
This talk focuses on Total Ionizing Dose (TID) effects on integrated circuits (IC) and prospects for their mitigation through Radiation-Hard-by-Design (RHBD) techniques. It also discusses the radiation-hardened ASIC design flow, in particular emphasizing the issues of efficient irradiation tests and characterization of the integrated test structures.
Original language | English |
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Publication status | Published - 2016 |
Event | Inauguration and Radhard Symposium - Seibersdorf Laboratories, Seibersdorf, Austria Duration: 7 Jun 2016 → 8 Jun 2016 |
Conference
Conference | Inauguration and Radhard Symposium |
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Country/Territory | Austria |
City | Seibersdorf |
Period | 7/06/16 → 8/06/16 |
Keywords
- Integrated circuits
- radiation hard by design
- X-rays
- radiation damage
- mitigation
Fields of Expertise
- Information, Communication & Computing