Radiation Effects from the Perspective of Analog IC Designer Radiation-Hard-by-Design

Research output: Contribution to conference(Old data) Lecture or Presentation

Abstract

In space-borne, medical and high energy physics applications, the heart of a measurement system is usually an Integrated Circuit (IC). More and more often Application-Specific Integrated Circuits (ASICs) are used instead of from-the-shelve products: ASIC offers lower power consumption than a standard IC or a discrete solution; also, higher measurement precision can be achieved, thanks to small capacitances and high speed, combined with a customized architecture.
This talk focuses on Total Ionizing Dose (TID) effects on integrated circuits (IC) and prospects for their mitigation through Radiation-Hard-by-Design (RHBD) techniques. It also discusses the radiation-hardened ASIC design flow, in particular emphasizing the issues of efficient irradiation tests and characterization of the integrated test structures.
Original languageEnglish
Publication statusPublished - 2016
EventInauguration and Radhard Symposium - Seibersdorf Laboratories, Seibersdorf, Austria
Duration: 7 Jun 20168 Jun 2016

Conference

ConferenceInauguration and Radhard Symposium
CountryAustria
CitySeibersdorf
Period7/06/168/06/16

Keywords

  • Integrated circuits
  • radiation hard by design
  • X-rays
  • radiation damage
  • mitigation

Fields of Expertise

  • Information, Communication & Computing

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    Michalowska-Forsyth, A. M., & Bezhenova, V. (2016). Radiation Effects from the Perspective of Analog IC Designer Radiation-Hard-by-Design. Inauguration and Radhard Symposium, Seibersdorf, Austria.