Radiation Effects from the Perspective of Analog IC Designer Radiation-Hard-by-Design

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Abstract

In space-borne, medical and high energy physics applications, the heart of a measurement system is usually an Integrated Circuit (IC). More and more often Application-Specific Integrated Circuits (ASICs) are used instead of from-the-shelve products: ASIC offers lower power consumption than a standard IC or a discrete solution; also, higher measurement precision can be achieved, thanks to small capacitances and high speed, combined with a customized architecture.
This talk focuses on Total Ionizing Dose (TID) effects on integrated circuits (IC) and prospects for their mitigation through Radiation-Hard-by-Design (RHBD) techniques. It also discusses the radiation-hardened ASIC design flow, in particular emphasizing the issues of efficient irradiation tests and characterization of the integrated test structures.

Conference

ConferenceInauguration and Radhard Symposium
CountryAustria
CitySeibersdorf
Period7/06/168/06/16

Fingerprint

Radiation effects
Application specific integrated circuits
Integrated circuits
Radiation
High energy physics
Electric power utilization
Capacitance
Irradiation
Analog integrated circuits

Keywords

  • Integrated circuits
  • radiation hard by design
  • X-rays
  • radiation damage
  • mitigation

Fields of Expertise

  • Information, Communication & Computing

Cite this

Radiation Effects from the Perspective of Analog IC Designer Radiation-Hard-by-Design. / Michalowska-Forsyth, Alicja Malgorzata; Bezhenova, Varvara.

2016. Inauguration and Radhard Symposium, Seibersdorf, Austria.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Michalowska-Forsyth, AM & Bezhenova, V 2016, 'Radiation Effects from the Perspective of Analog IC Designer Radiation-Hard-by-Design' Inauguration and Radhard Symposium, Seibersdorf, Austria, 7/06/16 - 8/06/16, .
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abstract = "In space-borne, medical and high energy physics applications, the heart of a measurement system is usually an Integrated Circuit (IC). More and more often Application-Specific Integrated Circuits (ASICs) are used instead of from-the-shelve products: ASIC offers lower power consumption than a standard IC or a discrete solution; also, higher measurement precision can be achieved, thanks to small capacitances and high speed, combined with a customized architecture.This talk focuses on Total Ionizing Dose (TID) effects on integrated circuits (IC) and prospects for their mitigation through Radiation-Hard-by-Design (RHBD) techniques. It also discusses the radiation-hardened ASIC design flow, in particular emphasizing the issues of efficient irradiation tests and characterization of the integrated test structures.",
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author = "Michalowska-Forsyth, {Alicja Malgorzata} and Varvara Bezhenova",
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note = "Inauguration and Radhard Symposium ; Conference date: 07-06-2016 Through 08-06-2016",

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AU - Michalowska-Forsyth,Alicja Malgorzata

AU - Bezhenova,Varvara

PY - 2016

Y1 - 2016

N2 - In space-borne, medical and high energy physics applications, the heart of a measurement system is usually an Integrated Circuit (IC). More and more often Application-Specific Integrated Circuits (ASICs) are used instead of from-the-shelve products: ASIC offers lower power consumption than a standard IC or a discrete solution; also, higher measurement precision can be achieved, thanks to small capacitances and high speed, combined with a customized architecture.This talk focuses on Total Ionizing Dose (TID) effects on integrated circuits (IC) and prospects for their mitigation through Radiation-Hard-by-Design (RHBD) techniques. It also discusses the radiation-hardened ASIC design flow, in particular emphasizing the issues of efficient irradiation tests and characterization of the integrated test structures.

AB - In space-borne, medical and high energy physics applications, the heart of a measurement system is usually an Integrated Circuit (IC). More and more often Application-Specific Integrated Circuits (ASICs) are used instead of from-the-shelve products: ASIC offers lower power consumption than a standard IC or a discrete solution; also, higher measurement precision can be achieved, thanks to small capacitances and high speed, combined with a customized architecture.This talk focuses on Total Ionizing Dose (TID) effects on integrated circuits (IC) and prospects for their mitigation through Radiation-Hard-by-Design (RHBD) techniques. It also discusses the radiation-hardened ASIC design flow, in particular emphasizing the issues of efficient irradiation tests and characterization of the integrated test structures.

KW - Integrated circuits

KW - radiation hard by design

KW - X-rays

KW - radiation damage

KW - mitigation

M3 - (Old data) Lecture or Presentation

ER -