Radiated Immunity Testing of Integrated Circuits in Reverberation Chambers

R. Heinrich, R. Bechly, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInternational Symposium on Electromagnetic Compatibility
Place of PublicationPiscataway, NY
PublisherInstitute of Electrical and Electronics Engineers
Pages1-4
ISBN (Print)978-1-4673-0718-5
DOIs
Publication statusPublished - 2012
EventInternational Symposium on Electromagnetic Compatibility - Rome, Italy
Duration: 17 Dec 201221 Dec 2012

Conference

ConferenceInternational Symposium on Electromagnetic Compatibility
CountryItaly
CityRome
Period17/12/1221/12/12

Fields of Expertise

  • Sonstiges

Cite this

Heinrich, R., Bechly, R., & Deutschmann, B. (2012). Radiated Immunity Testing of Integrated Circuits in Reverberation Chambers. In International Symposium on Electromagnetic Compatibility (pp. 1-4). Piscataway, NY: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EMCEurope.2012.6396877