Radiated Immunity Testing of Integrated Circuits in Reverberation Chambers

R. Heinrich, R. Bechly, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

LanguageEnglish
Title of host publicationInternational Symposium on Electromagnetic Compatibility
Place of PublicationPiscataway, NY
PublisherInstitute of Electrical and Electronics Engineers
Pages1-4
ISBN (Print)978-1-4673-0718-5
DOIs
StatusPublished - 2012
EventInternational Symposium on Electromagnetic Compatibility - Rome, Italy
Duration: 17 Dec 201221 Dec 2012

Conference

ConferenceInternational Symposium on Electromagnetic Compatibility
CountryItaly
CityRome
Period17/12/1221/12/12

Fields of Expertise

  • Sonstiges

Cite this

Heinrich, R., Bechly, R., & Deutschmann, B. (2012). Radiated Immunity Testing of Integrated Circuits in Reverberation Chambers. In International Symposium on Electromagnetic Compatibility (pp. 1-4). Piscataway, NY: Institute of Electrical and Electronics Engineers. DOI: 10.1109/EMCEurope.2012.6396877

Radiated Immunity Testing of Integrated Circuits in Reverberation Chambers. / Heinrich, R.; Bechly, R.; Deutschmann, Bernd.

International Symposium on Electromagnetic Compatibility. Piscataway, NY : Institute of Electrical and Electronics Engineers, 2012. p. 1-4.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Heinrich, R, Bechly, R & Deutschmann, B 2012, Radiated Immunity Testing of Integrated Circuits in Reverberation Chambers. in International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers, Piscataway, NY, pp. 1-4, International Symposium on Electromagnetic Compatibility, Rome, Italy, 17/12/12. DOI: 10.1109/EMCEurope.2012.6396877
Heinrich R, Bechly R, Deutschmann B. Radiated Immunity Testing of Integrated Circuits in Reverberation Chambers. In International Symposium on Electromagnetic Compatibility. Piscataway, NY: Institute of Electrical and Electronics Engineers. 2012. p. 1-4. Available from, DOI: 10.1109/EMCEurope.2012.6396877
Heinrich, R. ; Bechly, R. ; Deutschmann, Bernd. / Radiated Immunity Testing of Integrated Circuits in Reverberation Chambers. International Symposium on Electromagnetic Compatibility. Piscataway, NY : Institute of Electrical and Electronics Engineers, 2012. pp. 1-4
@inproceedings{e3b26491a83c4078ace9c75270ccb80b,
title = "Radiated Immunity Testing of Integrated Circuits in Reverberation Chambers",
author = "R. Heinrich and R. Bechly and Bernd Deutschmann",
year = "2012",
doi = "10.1109/EMCEurope.2012.6396877",
language = "English",
isbn = "978-1-4673-0718-5",
pages = "1--4",
booktitle = "International Symposium on Electromagnetic Compatibility",
publisher = "Institute of Electrical and Electronics Engineers",
address = "United States",

}

TY - GEN

T1 - Radiated Immunity Testing of Integrated Circuits in Reverberation Chambers

AU - Heinrich,R.

AU - Bechly,R.

AU - Deutschmann,Bernd

PY - 2012

Y1 - 2012

U2 - 10.1109/EMCEurope.2012.6396877

DO - 10.1109/EMCEurope.2012.6396877

M3 - Conference contribution

SN - 978-1-4673-0718-5

SP - 1

EP - 4

BT - International Symposium on Electromagnetic Compatibility

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway, NY

ER -