Quantitative Elemental Mapping at Atomic Resolution Using X-Ray Spectroscopy

Gerald Kothleitner, M.J. Neish, N.R. Lugg, S.D. Findlay, Werner Grogger, Ferdinand Hofer, L.J. Allen

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)085501-1-085501-5
JournalPhysical Review Letters
Publication statusPublished - 2014

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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