Quantitative EDXS analysis of organic materials using the ζ-factor method

Stefanie Fladischer, Werner Grogger

Research output: Contribution to journalArticleResearchpeer-review

Abstract

In this study we successfully applied the ζ-factor method to perform quantitative X-ray analysis of organic thin films consisting of light elements. With its ability to intrinsically correct for X-ray absorption, this method significantly improved the quality of the quantification as well as the accuracy of the results compared to conventional techniques in particular regarding the quantification of light elements. We describe in detail the process of determining sensitivity factors (ζ-factors) using a single standard specimen and the involved parameter optimization for the estimation of ζ-factors for elements not contained in the standard. The ζ-factor method was then applied to perform quantitative analysis of organic semiconducting materials frequently used in organic electronics. Finally, the results were verified and discussed concerning validity and accuracy.

Original languageEnglish
Pages (from-to)26-30
Number of pages5
JournalUltramicroscopy
Volume136
DOIs
Publication statusPublished - Jan 2014

Fingerprint

organic materials
quantitative analysis
light elements
X ray analysis
X ray absorption
Chemical analysis
Electronic equipment
Thin films
x rays
optimization
sensitivity
thin films
electronics

Keywords

  • ζ-factor method
  • CuPc
  • Light-element analysis
  • Organic material
  • PTCBi
  • Quantitative EDXS analysis

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electronic, Optical and Magnetic Materials

Cite this

Quantitative EDXS analysis of organic materials using the ζ-factor method. / Fladischer, Stefanie; Grogger, Werner.

In: Ultramicroscopy, Vol. 136, 01.2014, p. 26-30.

Research output: Contribution to journalArticleResearchpeer-review

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