Quantitative EDX and EELS Elemental Mapping at Atomic Resolution

Gerald Kothleitner, M.J. Neish, N.R. Lugg, S.D. Findlay, Werner Grogger, Ferdinand Hofer, L.J. Allen

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 4 Aug 2014
EventMicroscopy and Microanalysis 2014 - Hartford, USA
Duration: 3 Aug 20147 Aug 2014

Conference

ConferenceMicroscopy and Microanalysis 2014
CityHartford, USA
Period3/08/147/08/14

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Kothleitner, G., Neish, M. J., Lugg, N. R., Findlay, S. D., Grogger, W., Hofer, F., & Allen, L. J. (2014). Quantitative EDX and EELS Elemental Mapping at Atomic Resolution. Microscopy and Microanalysis 2014, Hartford, USA, .