Quantitative cS Corrected EDXS: Influence of Detector Geometry

Werner Grogger, Johanna Kraxner, Manuel Paller, Gerald Kothleitner

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 23 Apr 2015
EventPICO 2015 in Vaals - Vaals, Netherlands
Duration: 23 Apr 2015 → …

Conference

ConferencePICO 2015 in Vaals
CountryNetherlands
CityVaals
Period23/04/15 → …

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Grogger, W., Kraxner, J., Paller, M., & Kothleitner, G. (2015). Quantitative cS Corrected EDXS: Influence of Detector Geometry. PICO 2015 in Vaals, Vaals, Netherlands.

Quantitative cS Corrected EDXS: Influence of Detector Geometry. / Grogger, Werner; Kraxner, Johanna; Paller, Manuel; Kothleitner, Gerald.

2015. PICO 2015 in Vaals, Vaals, Netherlands.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Grogger, W, Kraxner, J, Paller, M & Kothleitner, G 2015, 'Quantitative cS Corrected EDXS: Influence of Detector Geometry' PICO 2015 in Vaals, Vaals, Netherlands, 23/04/15, .
Grogger W, Kraxner J, Paller M, Kothleitner G. Quantitative cS Corrected EDXS: Influence of Detector Geometry. 2015. PICO 2015 in Vaals, Vaals, Netherlands.
Grogger, Werner ; Kraxner, Johanna ; Paller, Manuel ; Kothleitner, Gerald. / Quantitative cS Corrected EDXS: Influence of Detector Geometry. PICO 2015 in Vaals, Vaals, Netherlands.
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note = "PICO 2015 in Vaals ; Conference date: 23-04-2015",

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Y1 - 2015/4/23

M3 - (Old data) Lecture or Presentation

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