Pushing the Limits of Environmental Scanning Electron Microscopy

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2016
EventThe 16th European Microscopy Congress - Lyon Convention Center, Lyon, France
Duration: 28 Aug 20162 Sep 2016
Conference number: 16
http://www.emc2016.fr/en/

Conference

ConferenceThe 16th European Microscopy Congress
Abbreviated titleEMC 2016
CountryFrance
CityLyon
Period28/08/162/09/16
Internet address

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Application

Cite this

Rattenberger, J., Fitzek, H. M., Schröttner, H., Wagner, J., & Hofer, F. (2016). Pushing the Limits of Environmental Scanning Electron Microscopy. Poster session presented at The 16th European Microscopy Congress, Lyon, France.

Pushing the Limits of Environmental Scanning Electron Microscopy. / Rattenberger, Johannes; Fitzek, Harald Matthias; Schröttner, Hartmuth; Wagner, Julian; Hofer, Ferdinand.

2016. Poster session presented at The 16th European Microscopy Congress, Lyon, France.

Research output: Contribution to conferencePosterResearch

Rattenberger, J, Fitzek, HM, Schröttner, H, Wagner, J & Hofer, F 2016, 'Pushing the Limits of Environmental Scanning Electron Microscopy' The 16th European Microscopy Congress, Lyon, France, 28/08/16 - 2/09/16, .
Rattenberger J, Fitzek HM, Schröttner H, Wagner J, Hofer F. Pushing the Limits of Environmental Scanning Electron Microscopy. 2016. Poster session presented at The 16th European Microscopy Congress, Lyon, France.
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title = "Pushing the Limits of Environmental Scanning Electron Microscopy",
author = "Johannes Rattenberger and Fitzek, {Harald Matthias} and Hartmuth Schr{\"o}ttner and Julian Wagner and Ferdinand Hofer",
year = "2016",
language = "English",
note = "The 16th European Microscopy Congress, EMC 2016 ; Conference date: 28-08-2016 Through 02-09-2016",
url = "http://www.emc2016.fr/en/",

}

TY - CONF

T1 - Pushing the Limits of Environmental Scanning Electron Microscopy

AU - Rattenberger, Johannes

AU - Fitzek, Harald Matthias

AU - Schröttner, Hartmuth

AU - Wagner, Julian

AU - Hofer, Ferdinand

PY - 2016

Y1 - 2016

M3 - Poster

ER -