Pulse Frequency Effects on Probability of ESD Soft Failures for a Specific Camera Subsystem

Yanlin Nie, Qiupei Huang, Xiang Li, Xiaofei Xie, David Johannes Pommerenke, Zhiwei Liu, Jizhi Liu

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

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Physics & Astronomy

Engineering & Materials Science