Problems with the electrostatic discharge (ESD) immunity test in electromagnetic compatibility (EMC)

Jiusheng Huang, D. Pommerenke, Wei Huang

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Abstract

The electrostatic discharge (ESD) immunity test is one of the important electromagnetic compatibility (EMC) tests. The IEC standard IEC61000-4-2 is the widely used standard to test the ESD immunity for electronic equipment. Many amendments such as amendment 1 (1998), and amendment 2 (2000) have been published since 1995, but there are still problems with the ESD immunity test even with the 200x version. More than six ESD generators of different bands are tested for different equipments. The results show that the failure voltages of different ESD generators vary widely from different bands for the same test equipment. This may lead to noncomparable results when testing the ESD immunity in the EMC. Further studies show that there is a good correlation between the failure voltage and the induced voltage.

Original languageEnglish
Title of host publicationProceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM 2003
EditorsYang Qianli, Gao Yougang
PublisherInstitute of Electrical and Electronics Engineers
Pages251-254
Number of pages4
ISBN (Electronic)7563508023, 9787563508020
DOIs
Publication statusPublished - 1 Jan 2003
Externally publishedYes
Event3rd Asia-Pacific Conference on Environmental Electromagnetics, CEEM 2003 - Hangzhou, China
Duration: 4 Nov 20037 Nov 2003

Publication series

NameProceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM 2003

Conference

Conference3rd Asia-Pacific Conference on Environmental Electromagnetics, CEEM 2003
CountryChina
CityHangzhou
Period4/11/037/11/03

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ASJC Scopus subject areas

  • Computer Networks and Communications
  • Radiation

Cite this

Huang, J., Pommerenke, D., & Huang, W. (2003). Problems with the electrostatic discharge (ESD) immunity test in electromagnetic compatibility (EMC). In Y. Qianli, & G. Yougang (Eds.), Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM 2003 (pp. 251-254). [1282319] (Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM 2003). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CEEM.2003.237958