Probe characterization and data process for current reconstruction by near field scanning method

Wel Huang, Dazhao Liu, Jiang Xiao, David Pommerenke, Jin Min, Giorgi Muchaidze

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Abstract

Previously a measurement technique for ESD current spreading on a PCB using near field scanning was developed in order to connect the local ESD sensitivity to system level ESD failures in time and spatial domain. The concept of such scanning methodology is proved and several scanning results were processed. However the validation, precision and weakness of such methodology need to be further investigated before the application of such scanning methodology on complex circuit or system. This article investigates the current reconstruction by near field scanning technique and methodology. It studies the probe factors including coupling frequency response characterization and deconvolution method, spatial resolution for scanning and orthogonal-scan data combine process.

Original languageEnglish
Title of host publication2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
Pages467-470
Number of pages4
DOIs
Publication statusPublished - 2 Aug 2010
Externally publishedYes
Event2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 - Beijing, China
Duration: 12 Apr 201016 Apr 2010

Publication series

Name2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

Conference

Conference2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
CountryChina
CityBeijing
Period12/04/1016/04/10

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Huang, W., Liu, D., Xiao, J., Pommerenke, D., Min, J., & Muchaidze, G. (2010). Probe characterization and data process for current reconstruction by near field scanning method. In 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 (pp. 467-470). [5475504] (2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010). https://doi.org/10.1109/APEMC.2010.5475504