Preliminary Study on the Impact of Place and Route Strategy on FPGA Electromagnetic Emission

Estevan L. Lara, Allan A. Constante, Juliano Benfica, Fabian Vargas, Alexandre Boyer, Sonia B. Dhia, Andreas Gleinser, Gunter Winkler, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

Dense integration and high operating frequencies associated with increased number of I/O buffers of FPGAs are factors contributing to electromagnetic emission (EME) increase. Consequently the radiation issue that used to be discussed at PCB level has shifted to component level. Thus it is of high interest and challenging to investigate chip electromagnetic performance. This paper presents a preliminary analysis about the impact of the placement and routing (PR) process of logic inside the FPGA on the chip EME level. With this purpose, a softcore processor was placed and routed based on three different strategies in the configurable logic block (CLB) array of a commercial FPGA and executed an application code running over an operating system (OS). Three experiments based on far- and near-field emission measurements have been performed.-The obtained results indicate that the EME level can be affected up to 21.8% by the way the processor is placed and routed inside the FPGA.

Original languageEnglish
Title of host publication2021 Argentine Conference on Electronics - Congreso Argentino de Electronica 2021, CAE 2021
PublisherInstitute of Electrical and Electronics Engineers
Pages88-92
Number of pages5
ISBN (Electronic)9781728175799
DOIs
Publication statusPublished - 11 Mar 2021
Event2021 Argentine Conference on Electronics - Bahia Blanca, Virtuell, Argentina
Duration: 11 Mar 202112 Mar 2021

Conference

Conference2021 Argentine Conference on Electronics
Abbreviated titleCAE 2021
Country/TerritoryArgentina
CityVirtuell
Period11/03/2112/03/21

Keywords

  • Commercial Field-Programmable Gate Array (FPGA)
  • Electromagnetic emission (EME)
  • GTEM Cell Test Method
  • Logic place and route process
  • Reliability
  • Surface Scan Test Method

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Instrumentation

Fields of Expertise

  • Information, Communication & Computing

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