Prediction of the robustness of integrated circuits against EFT/BURST

Susanne Maria Bauer, Bernd Deutschmann, Gunter Winkler

Research output: Chapter in Book/Report/Conference proceedingConference paper

Original languageEnglish
Title of host publication2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)
PublisherInstitute of Electrical and Electronics Engineers
Pages45-49
ISBN (Print)978-1-4799-6615-8
DOIs
Publication statusPublished - 2015
EventIEEE International Symposium on Electromagnetic Compatibility: EMC 2015 - Dresden, Germany
Duration: 16 Aug 201522 Aug 2015

Conference

ConferenceIEEE International Symposium on Electromagnetic Compatibility
CountryGermany
CityDresden
Period16/08/1522/08/15

Fields of Expertise

  • Sonstiges

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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