Prediction of the robustness of integrated circuits against EFT/BURST

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publication2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)
PublisherInstitute of Electrical and Electronics Engineers
Pages45-49
ISBN (Print)978-1-4799-6615-8
DOIs
Publication statusPublished - 2015
EventInternational Symposium on Electromagnetic Compatibility - Dresden, Germany
Duration: 16 Aug 201522 Aug 2015

Conference

ConferenceInternational Symposium on Electromagnetic Compatibility
CountryGermany
CityDresden
Period16/08/1522/08/15

Fields of Expertise

  • Sonstiges

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Bauer, S. M., Deutschmann, B., & Winkler, G. (2015). Prediction of the robustness of integrated circuits against EFT/BURST. In 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) (pp. 45-49). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISEMC.2015.7256130

Prediction of the robustness of integrated circuits against EFT/BURST. / Bauer, Susanne Maria; Deutschmann, Bernd; Winkler, Gunter.

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC). Institute of Electrical and Electronics Engineers, 2015. p. 45-49.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Bauer, SM, Deutschmann, B & Winkler, G 2015, Prediction of the robustness of integrated circuits against EFT/BURST. in 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC). Institute of Electrical and Electronics Engineers, pp. 45-49, International Symposium on Electromagnetic Compatibility, Dresden, Germany, 16/08/15. https://doi.org/10.1109/ISEMC.2015.7256130
Bauer SM, Deutschmann B, Winkler G. Prediction of the robustness of integrated circuits against EFT/BURST. In 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC). Institute of Electrical and Electronics Engineers. 2015. p. 45-49 https://doi.org/10.1109/ISEMC.2015.7256130
Bauer, Susanne Maria ; Deutschmann, Bernd ; Winkler, Gunter. / Prediction of the robustness of integrated circuits against EFT/BURST. 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC). Institute of Electrical and Electronics Engineers, 2015. pp. 45-49
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