Prediction of the robustness of integrated circuits against EFT/BURST

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)
PublisherInstitute of Electrical and Electronics Engineers
Pages45-49
ISBN (Print)978-1-4799-6615-8
DOIs
Publication statusPublished - 2015
EventInternational Symposium on Electromagnetic Compatibility - Dresden, Germany
Duration: 16 Aug 201522 Aug 2015

Conference

ConferenceInternational Symposium on Electromagnetic Compatibility
CountryGermany
CityDresden
Period16/08/1522/08/15

Fields of Expertise

  • Sonstiges

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Bauer, S. M., Deutschmann, B., & Winkler, G. (2015). Prediction of the robustness of integrated circuits against EFT/BURST. In 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) (pp. 45-49). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISEMC.2015.7256130