Predicting EMI induced delay errors in integrated circuits: Sensitivity to the velocity saturation index

Xu Gao, Chunchun Sui, Sameer Hemmady, Joey Rivera, Lisa Andivahis, David Pommerenke, Daryl Beetner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Integrated circuits (ICs) sometimes fail when their power supply is disrupted by external noise, such as might occur during an electrical fast transient (EFT). A delay model was proposed in [1] which can be used to predict the variations in the delays through logic circuits caused by electromagnetic induced noise in the power supply voltage. This model is relatively simple and requires few parameters, giving it the potential to be used even when the IC is a 'black bos' and little information is available about the inner circuits. While design information might be approximated through testing, critical process characteristics may not be available which are needed for accurate results. The parameter of greatest concern is the velocity saturation index, since this parameter can exponentially increase the impact of power supply noise on delay. This paper describes an investigation of the sensitivity of the delay model in [1] to the velocity saturation index. Results indicate that the estimated delay, found while treating much of the circuit as a black box, is largely insensitive to the velocity saturation index. This result suggests that this model can be used effectively for prediction of electromagnetically-induced delay errors, even when limited process or circuit information is known.

Original languageEnglish
Title of host publication2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015
PublisherInstitute of Electrical and Electronics Engineers
Pages102-105
Number of pages4
ISBN (Electronic)9781479966707
DOIs
Publication statusPublished - 3 Aug 2015
Externally publishedYes
EventAsia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015 - Taipei, Taiwan, Province of China
Duration: 25 May 201529 May 2015

Publication series

Name2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015

Conference

ConferenceAsia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015
CountryTaiwan, Province of China
CityTaipei
Period25/05/1529/05/15

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

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