Power and Thermal Fault Effect Exploration Framework for Reader / Smart Card Designs

Norbert Druml, Manuel Menghin, Tobias Rauter, Christian Steger, Reinhold Weiß, Christian Bachmann, Holger Bock, Josef Haid

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publication16th Euromicro Conference on Digital System Design (DSD)
Publisher.
Pages898-906
Publication statusPublished - 2013
Event16th Euromicro Conference on Digital System Design (DSD) - Santander
Duration: 4 Sep 20136 Sep 2013

Conference

Conference16th Euromicro Conference on Digital System Design (DSD)
CitySantander
Period4/09/136/09/13

Fields of Expertise

  • Information, Communication & Computing

Cite this

Druml, N., Menghin, M., Rauter, T., Steger, C., Weiß, R., Bachmann, C., ... Haid, J. (2013). Power and Thermal Fault Effect Exploration Framework for Reader / Smart Card Designs. In 16th Euromicro Conference on Digital System Design (DSD) (pp. 898-906). ..

Power and Thermal Fault Effect Exploration Framework for Reader / Smart Card Designs. / Druml, Norbert; Menghin, Manuel; Rauter, Tobias; Steger, Christian; Weiß, Reinhold; Bachmann, Christian; Bock, Holger; Haid, Josef.

16th Euromicro Conference on Digital System Design (DSD). ., 2013. p. 898-906.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Druml, N, Menghin, M, Rauter, T, Steger, C, Weiß, R, Bachmann, C, Bock, H & Haid, J 2013, Power and Thermal Fault Effect Exploration Framework for Reader / Smart Card Designs. in 16th Euromicro Conference on Digital System Design (DSD). ., pp. 898-906, 16th Euromicro Conference on Digital System Design (DSD), Santander, 4/09/13.
Druml N, Menghin M, Rauter T, Steger C, Weiß R, Bachmann C et al. Power and Thermal Fault Effect Exploration Framework for Reader / Smart Card Designs. In 16th Euromicro Conference on Digital System Design (DSD). . 2013. p. 898-906
Druml, Norbert ; Menghin, Manuel ; Rauter, Tobias ; Steger, Christian ; Weiß, Reinhold ; Bachmann, Christian ; Bock, Holger ; Haid, Josef. / Power and Thermal Fault Effect Exploration Framework for Reader / Smart Card Designs. 16th Euromicro Conference on Digital System Design (DSD). ., 2013. pp. 898-906
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