Polymer Thin Film Characterization: A Combined Approach by X-ray Reflectivity and Spectroscopic Ellipsometry

Heinz-Georg Flesch, Oliver Werzer, Paul Frank, Alexander Blümel, Jan Jakabovic, Jaroslav Kovac, Georg Jakopic, Roland Resel

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2008
EventWinter School on Organic Electronics: The Role of Interfaces - Planneralm, Austria
Duration: 27 Jan 200831 Aug 2008

Conference

ConferenceWinter School on Organic Electronics: The Role of Interfaces
CountryAustria
CityPlanneralm
Period27/01/0831/08/08

Treatment code (Nähere Zuordnung)

  • Experimental

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