Polymer Thin Film Characterization: A Combined Approach by X-ray Reflectivity and Spectroscopic Ellipsometry

Heinz-Georg Flesch; Oliver Werzer; Paul Frank; Alexander Blümel; Jan Jakabovic; Jaroslav Kovac; Georg Jakopic; Roland Resel

Polymer Thin Film Characterization: A Combined Approach by X-ray Reflectivity and Spectroscopic Ellipsometry

Heinz-Georg Flesch, Oliver Werzer, Paul Frank, Alexander Blümel, Jan Jakabovic, Jaroslav Kovac, Georg Jakopic, Roland Resel

Institute of Solid State Physics (5130)

Research output: Contribution to conference › Poster

Original language	English
Publication status	Published - 2008
Event	Winter School on Organic Electronics: The Role of Interfaces - Planneralm, Austria Duration: 27 Jan 2008 → 31 Aug 2008

Conference

Conference	Winter School on Organic Electronics: The Role of Interfaces
Country/Territory	Austria
City	Planneralm
Period	27/01/08 → 31/08/08

Treatment code (Nähere Zuordnung)

Experimental

Cite this

@conference{e25f55ae3ebe426fbf1c3332e76c3b49,

title = "Polymer Thin Film Characterization: A Combined Approach by X-ray Reflectivity and Spectroscopic Ellipsometry",

author = "Heinz-Georg Flesch and Oliver Werzer and Paul Frank and Alexander Bl{\"u}mel and Jan Jakabovic and Jaroslav Kovac and Georg Jakopic and Roland Resel",

year = "2008",

language = "English",

note = "Winter School on Organic Electronics: The Role of Interfaces ; Conference date: 27-01-2008 Through 31-08-2008",

}

TY - CONF

T1 - Polymer Thin Film Characterization: A Combined Approach by X-ray Reflectivity and Spectroscopic Ellipsometry

AU - Flesch, Heinz-Georg

AU - Werzer, Oliver

AU - Frank, Paul

AU - Blümel, Alexander

AU - Jakabovic, Jan

AU - Kovac, Jaroslav

AU - Jakopic, Georg

AU - Resel, Roland

PY - 2008

Y1 - 2008

M3 - Poster

T2 - Winter School on Organic Electronics: The Role of Interfaces

Y2 - 27 January 2008 through 31 August 2008

ER -