Plasmon modes of a silver thin film taper probed with STEM-EELS

Franz-Philipp Schmidt, Harald Ditlbacher, Andreas Trügler, Ulrich Hohenester, Andreas Hohenau, Ferdinand Hofer, Joachim R. Krenn

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)5670-5673
JournalOptics letters
Volume40
Issue number23
DOIs
Publication statusPublished - 2015

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Schmidt, F-P., Ditlbacher, H., Trügler, A., Hohenester, U., Hohenau, A., Hofer, F., & Krenn, J. R. (2015). Plasmon modes of a silver thin film taper probed with STEM-EELS. Optics letters, 40(23), 5670-5673. https://doi.org/10.1364/OL.40.005670