Pin specific ESD soft failure characterization using a fully automated set-up

Giorgi Maghlakelidze, Pengyu Wei, Wei Huang, Harald Gossner, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A fully automated system is developed for the systematic characterization of soft failure robustness for a DUT. The methodology is founded on software-based detection methods and applied to a USB3 interface. The approach is extendable to other interfaces and measurement-based failure detection methods.

Original languageEnglish
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018
PublisherESD Association
ISBN (Electronic)1585373028
Publication statusPublished - 25 Oct 2018
Externally publishedYes
Event40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 - Reno, United States
Duration: 23 Sep 201828 Sep 2018

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2018-September
ISSN (Print)0739-5159

Conference

Conference40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018
CountryUnited States
CityReno
Period23/09/1828/09/18

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Maghlakelidze, G., Wei, P., Huang, W., Gossner, H., & Pommerenke, D. (2018). Pin specific ESD soft failure characterization using a fully automated set-up. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Vol. 2018-September). ESD Association.