Photocharge-modulated passive intermodulation on AgO/Ag junction in high-power microwave devices

Xiong Chen, Yongning He, David J. Pommerenke, Jun Fan

Research output: Contribution to journalArticleResearchpeer-review

Abstract

This letter studies the photocharge-modulated passive intermodulation (PIM) effect on the Ag2O/Ag contact junction. It is demonstrated that the photocharge with the parasitic parameters on the contact junction can modulate the electron transport process and make the PIM components changed with photoillumination. The linear RC constant can change the nonlinear current strength, under the periodical photostimulation, and PIM components will vary with the photopulses. In the experiment, by using a specially designed coaxial fixture to measure the PIM response with RC components on the contact junction, a semianalytical model for this photoeffect-modulated contact PIM is demonstrated.

Original languageEnglish
Article number9001207
Pages (from-to)268-271
Number of pages4
JournalIEEE Microwave and Wireless Components Letters
Volume30
Issue number3
DOIs
Publication statusPublished - 1 Mar 2020

Keywords

  • Contact nonlinearity
  • passive intermodulation (PIM)
  • photocharge modulation
  • silver oxide

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Photocharge-modulated passive intermodulation on AgO/Ag junction in high-power microwave devices'. Together they form a unique fingerprint.

  • Cite this