Pattern Trails: Visual Analysis of Pattern Evolutions in Subspaces

Dominik Jäckle, Michael Hund, Michael Behrisch, Daniel A. Keim, T. Schreck

Research output: Contribution to conferencePaper

Original languageEnglish
Number of pages12
Publication statusAccepted/In press - 2017
EventVAST 2017: IEEE Conference on Visual Analytics Science and Technology - Phoenix, United States
Duration: 1 Oct 20176 Oct 2017


ConferenceVAST 2017
Abbreviated titleIEEE VAST
CountryUnited States


  • Data analysis
  • Data visualization
  • Density measurement
  • Feature extraction
  • Layout
  • Symmetric matrices
  • Visualization
  • Feature Detection/Selection
  • Matrix Visualization
  • Quality Metrics
  • Relational Data
  • Visual Quality Measures

Fields of Expertise

  • Information, Communication & Computing

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