Passband frequency response measurement of a high voltage differential probe up to 10 MHz

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Abstract

High voltage differential probes are widely used for measurements in power electronics. For accurate measurements in power electronics, the use of probes with flat passband frequency response is indispensable. In this article we present a measurement method to evaluate the passband frequency response of a probe up to 10 MHz. We introduce an oscilloscope based setup, including a calibration procedure with a reference attenuator. Amplitude and phase estimation of the oscilloscope data is done with enhanced versions of the IEEE 1057 and 1251 sine-wave fit algorithms. The feasibility of the presented method is verified by a detailed uncertainty evaluation for the complex valued passband frequency response. The uncertainty assessment is done with two different methods, provided by the Guide to the Expression of Uncertainty in Measurement (GUM) and the associated Supplement 2.

Original languageEnglish
Title of host publicationI2MTC 2019 - 2019 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9781538634608
DOIs
Publication statusPublished - 1 May 2019
Event2019 IEEE International Instrumentation and Measurement Technology Conference - Auckland, New Zealand
Duration: 20 May 201923 May 2019

Conference

Conference2019 IEEE International Instrumentation and Measurement Technology Conference
Abbreviated titleI2MTC 2019
CountryNew Zealand
CityAuckland
Period20/05/1923/05/19

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Keywords

  • Frequency response
  • GUM
  • Sine-wave fit
  • Standard 1057 and 1251
  • Uncertainty
  • Voltage probe

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Grubmüller, M., & Neumayer, M. (2019). Passband frequency response measurement of a high voltage differential probe up to 10 MHz. In I2MTC 2019 - 2019 IEEE International Instrumentation and Measurement Technology Conference, Proceedings [8827019] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/I2MTC.2019.8827019