Orthogonal loops probe design and characterization for near-field measurement

Tun Li; Yong Cheh Ho; David Pommerenke

doi:10.1109/ISEMC.2008.4652138

Orthogonal loops probe design and characterization for near-field measurement

Research output: Contribution to journal › Conference article › peer-review

Abstract

Near-field probes are often used to measure the electric and magnetic fields above a printed circuit board in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. It is the objective of this paper to propose a rapid E-, Hx-Hy-and circular H-fields measurement using an orthogonal loops probe design. The effects of this probe are analyzed using full-wave simulations and measurements.

Original language	English
Article number	4652138
Journal	IEEE International Symposium on Electromagnetic Compatibility
Volume	2008-January
DOIs	https://doi.org/10.1109/ISEMC.2008.4652138
Publication status	Published - 1 Jan 2008
Externally published	Yes
Event	2008 IEEE International Symposium on Electromagnetic Compatibility: EMC 2008 - Detroit, United States Duration: 18 Aug 2008 → 22 Aug 2008

Keywords

Orthogonal loops
phase shifting

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/ISEMC.2008.4652138

Cite this

@article{3c8025ea575345aab36c402f9e8b64aa,

title = "Orthogonal loops probe design and characterization for near-field measurement",

abstract = "Near-field probes are often used to measure the electric and magnetic fields above a printed circuit board in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. It is the objective of this paper to propose a rapid E-, Hx-Hy-and circular H-fields measurement using an orthogonal loops probe design. The effects of this probe are analyzed using full-wave simulations and measurements.",

keywords = "Orthogonal loops, phase shifting",

author = "Tun Li and Ho, {Yong Cheh} and David Pommerenke",

year = "2008",

month = jan,

day = "1",

doi = "10.1109/ISEMC.2008.4652138",

language = "English",

volume = "2008-January",

journal = "IEEE International Symposium on Electromagnetic Compatibility",

issn = "1077-4076",

publisher = "Institute of Electrical and Electronics Engineers",

note = "2008 IEEE International Symposium on Electromagnetic Compatibility : EMC 2008 ; Conference date: 18-08-2008 Through 22-08-2008",

}

TY - JOUR

T1 - Orthogonal loops probe design and characterization for near-field measurement

AU - Li, Tun

AU - Ho, Yong Cheh

AU - Pommerenke, David

PY - 2008/1/1

Y1 - 2008/1/1

N2 - Near-field probes are often used to measure the electric and magnetic fields above a printed circuit board in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. It is the objective of this paper to propose a rapid E-, Hx-Hy-and circular H-fields measurement using an orthogonal loops probe design. The effects of this probe are analyzed using full-wave simulations and measurements.

AB - Near-field probes are often used to measure the electric and magnetic fields above a printed circuit board in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. It is the objective of this paper to propose a rapid E-, Hx-Hy-and circular H-fields measurement using an orthogonal loops probe design. The effects of this probe are analyzed using full-wave simulations and measurements.

KW - Orthogonal loops

KW - phase shifting

UR - http://www.scopus.com/inward/record.url?scp=85058003213&partnerID=8YFLogxK

U2 - 10.1109/ISEMC.2008.4652138

DO - 10.1109/ISEMC.2008.4652138

M3 - Conference article

AN - SCOPUS:85058003213

SN - 1077-4076

VL - 2008-January

JO - IEEE International Symposium on Electromagnetic Compatibility

JF - IEEE International Symposium on Electromagnetic Compatibility

M1 - 4652138

T2 - 2008 IEEE International Symposium on Electromagnetic Compatibility

Y2 - 18 August 2008 through 22 August 2008

ER -

Orthogonal loops probe design and characterization for near-field measurement

Abstract

Keywords

ASJC Scopus subject areas

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