Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure

Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, Nadezda Matsko, Heinz-Georg Flesch, Armin Moser, Jiri Novak, E. Kraker, A. Haase, Werner Grogger, Roland Resel

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInternational Conference on Organic Electronics
Publisher.
Pages237-237
Publication statusPublished - 2010
EventInternational Conference of Organic Electronics 2010 - Paris, Frankreich
Duration: 22 Jun 201025 Jun 2010

Conference

ConferenceInternational Conference of Organic Electronics 2010
CityParis, Frankreich
Period22/06/1025/06/10

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Neuhold, A., Fladischer, S., Mitsche, S., Matsko, N., Flesch, H-G., Moser, A., ... Resel, R. (2010). Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure. In International Conference on Organic Electronics (pp. 237-237). ..

Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure. / Neuhold, Alfred; Fladischer, Stefanie; Mitsche, Stefan; Matsko, Nadezda; Flesch, Heinz-Georg; Moser, Armin; Novak, Jiri; Kraker, E.; Haase, A.; Grogger, Werner; Resel, Roland.

International Conference on Organic Electronics. ., 2010. p. 237-237.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Neuhold, A, Fladischer, S, Mitsche, S, Matsko, N, Flesch, H-G, Moser, A, Novak, J, Kraker, E, Haase, A, Grogger, W & Resel, R 2010, Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure. in International Conference on Organic Electronics. ., pp. 237-237, International Conference of Organic Electronics 2010, Paris, Frankreich, 22/06/10.
Neuhold A, Fladischer S, Mitsche S, Matsko N, Flesch H-G, Moser A et al. Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure. In International Conference on Organic Electronics. . 2010. p. 237-237
Neuhold, Alfred ; Fladischer, Stefanie ; Mitsche, Stefan ; Matsko, Nadezda ; Flesch, Heinz-Georg ; Moser, Armin ; Novak, Jiri ; Kraker, E. ; Haase, A. ; Grogger, Werner ; Resel, Roland. / Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure. International Conference on Organic Electronics. ., 2010. pp. 237-237
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AU - Flesch, Heinz-Georg

AU - Moser, Armin

AU - Novak, Jiri

AU - Kraker, E.

AU - Haase, A.

AU - Grogger, Werner

AU - Resel, Roland

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