OPTIMIZING THE ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE – GETTING HIGH IMAGE QUALITY ABOVE 1000 PA

Research output: Contribution to conferenceAbstract

Original languageEnglish
PagesO-159-166-167
Publication statusPublished - 2015
EventMultinational Congress on Microscopy - Eger, Hungary
Duration: 23 Aug 201528 Aug 2015

Conference

ConferenceMultinational Congress on Microscopy
CountryHungary
CityEger
Period23/08/1528/08/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this