Optimizing of Baking Processes by Means of Electrical Capacitance Tomography

Markus Neumayer, Michael Johannes Moser, Boby George, Hubert Zangl

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings of the 6th World Congress On Industrial Process Tomography
Publisher	.
Publication status	Accepted/In press - 2010
Event	6th World Congress On Industrial Process Tomography: WCIPT6 - Peking, China Duration: 6 Sept 2010 → 9 Sept 2010

Conference	6th World Congress On Industrial Process Tomography
Country/Territory	China
City	Peking
Period	6/09/10 → 9/09/10

Cite this

@inproceedings{63695d76f4b64865b3fdc41c695f768d,

title = "Optimizing of Baking Processes by Means of Electrical Capacitance Tomography",

author = "Markus Neumayer and Moser, {Michael Johannes} and Boby George and Hubert Zangl",

year = "2010",

language = "English",

booktitle = "Proceedings of the 6th World Congress On Industrial Process Tomography",

publisher = ".",

note = "6th World Congress On Industrial Process Tomography : WCIPT6 ; Conference date: 06-09-2010 Through 09-09-2010",

}

TY - GEN

T1 - Optimizing of Baking Processes by Means of Electrical Capacitance Tomography

AU - Neumayer, Markus

AU - Moser, Michael Johannes

AU - George, Boby

AU - Zangl, Hubert

PY - 2010

Y1 - 2010

M3 - Conference paper

BT - Proceedings of the 6th World Congress On Industrial Process Tomography

PB - .

T2 - 6th World Congress On Industrial Process Tomography

Y2 - 6 September 2010 through 9 September 2010

ER -