Optical Coherence Tomography: A New PAT-Tool for Fast and Non-Destructive Analysis of Tablet Coating Quality

Daniel M. Koller, Christoph Schinwald, Otto Scheibelhofer, Michael Leitner, Johannes Khinast

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageGerman
Publication statusPublished - 16 Oct 2011
Event2011 AIChE Annual Meeting - Minneapolis, Minnesota, USA
Duration: 17 Oct 201121 Oct 2011

Conference

Conference2011 AIChE Annual Meeting
CityMinneapolis, Minnesota, USA
Period17/10/1121/10/11

Fields of Expertise

  • Human- & Biotechnology

Cite this

Koller, D. M., Schinwald, C., Scheibelhofer, O., Leitner, M., & Khinast, J. (2011). Optical Coherence Tomography: A New PAT-Tool for Fast and Non-Destructive Analysis of Tablet Coating Quality. 2011 AIChE Annual Meeting, Minneapolis, Minnesota, USA, .

Optical Coherence Tomography: A New PAT-Tool for Fast and Non-Destructive Analysis of Tablet Coating Quality. / Koller, Daniel M.; Schinwald, Christoph; Scheibelhofer, Otto; Leitner, Michael; Khinast, Johannes.

2011. 2011 AIChE Annual Meeting, Minneapolis, Minnesota, USA, .

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Koller, DM, Schinwald, C, Scheibelhofer, O, Leitner, M & Khinast, J 2011, 'Optical Coherence Tomography: A New PAT-Tool for Fast and Non-Destructive Analysis of Tablet Coating Quality' 2011 AIChE Annual Meeting, Minneapolis, Minnesota, USA, 17/10/11 - 21/10/11, .
Koller DM, Schinwald C, Scheibelhofer O, Leitner M, Khinast J. Optical Coherence Tomography: A New PAT-Tool for Fast and Non-Destructive Analysis of Tablet Coating Quality. 2011. 2011 AIChE Annual Meeting, Minneapolis, Minnesota, USA, .
Koller, Daniel M. ; Schinwald, Christoph ; Scheibelhofer, Otto ; Leitner, Michael ; Khinast, Johannes. / Optical Coherence Tomography: A New PAT-Tool for Fast and Non-Destructive Analysis of Tablet Coating Quality. 2011 AIChE Annual Meeting, Minneapolis, Minnesota, USA, .
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T1 - Optical Coherence Tomography: A New PAT-Tool for Fast and Non-Destructive Analysis of Tablet Coating Quality

AU - Koller, Daniel M.

AU - Schinwald, Christoph

AU - Scheibelhofer, Otto

AU - Leitner, Michael

AU - Khinast, Johannes

PY - 2011/10/16

Y1 - 2011/10/16

M3 - (Altdaten) Vortrag oder Präsentation

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