On Using Off-the-Shelf Micro Projectors for 3D Metrology

Martin Lenz, Matthias Rüther, Horst Bischof

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationVisual Learning
Place of PublicationWien
Publisher.
Pages153-164
Volume254
ISBN (Print)978-3-85403-254-0
Publication statusPublished - 2009
EventWorkshop of the Austrian Association for Pattern Recognition - Stainz, Austria
Duration: 14 May 200915 May 2009

Publication series

Namebooks@ocg.at

Conference

ConferenceWorkshop of the Austrian Association for Pattern Recognition
CountryAustria
CityStainz
Period14/05/0915/05/09

Cite this

Lenz, M., Rüther, M., & Bischof, H. (2009). On Using Off-the-Shelf Micro Projectors for 3D Metrology. In Visual Learning (Vol. 254, pp. 153-164). (books@ocg.at). Wien: ..

On Using Off-the-Shelf Micro Projectors for 3D Metrology. / Lenz, Martin; Rüther, Matthias; Bischof, Horst.

Visual Learning. Vol. 254 Wien : ., 2009. p. 153-164 (books@ocg.at).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Lenz, M, Rüther, M & Bischof, H 2009, On Using Off-the-Shelf Micro Projectors for 3D Metrology. in Visual Learning. vol. 254, books@ocg.at, ., Wien, pp. 153-164, Workshop of the Austrian Association for Pattern Recognition, Stainz, Austria, 14/05/09.
Lenz M, Rüther M, Bischof H. On Using Off-the-Shelf Micro Projectors for 3D Metrology. In Visual Learning. Vol. 254. Wien: . 2009. p. 153-164. (books@ocg.at).
Lenz, Martin ; Rüther, Matthias ; Bischof, Horst. / On Using Off-the-Shelf Micro Projectors for 3D Metrology. Visual Learning. Vol. 254 Wien : ., 2009. pp. 153-164 (books@ocg.at).
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