On the Robustness of CMOS-Chopped Operational Amplifiers to Conducted Electromagnetic Interferences

Andrea Lavarda, Luca Petruzzi, Nejc Radez, Bernd Deutschmann

Research output: Contribution to journalArticleResearchpeer-review

Abstract

This paper deals with the robustness of low power chopped CMOS operational amplifiers (OpAMPs) to electromagnetic interferences (EMI) conducted at the device input stage. The main differences between chopped amplifiers and standard offset uncompensated ones are analyzed in terms of EMI susceptibility, achieving three main results. First, a new model is developed to show how chopping influences the amplifier susceptibility in a broadband sense, demonstrating that chopped OpAMPs generate a lower amount of EMI-induced offset from the nonlinear distortion with respect to standard ones because of the topological differences between the respective input stages. Second, a model to predict the effects of EMI appearing at the multiples of the chopping frequency is derived, showing that chopped OpAMPs can experience dc shift peaks because of the linear distortion of the disturbances whose frequencies hit the even multiples of the chopping frequency. Finally, the simultaneous presence of the technological offset and the offset produced by the nonlinear and the linear distortion of EMI in chopped OpAMP is illustrated by means of dedicated EMI susceptibility measurements performed on several devices designed to validate the analysis.

LanguageEnglish
Pages478-486
JournalIEEE Transactions on Electromagnetic Compatibility
Volume60
Issue number2
DOIs
StatusE-pub ahead of print - 2017

Fingerprint

operational amplifiers
electromagnetic interference
Operational amplifiers
Signal interference
CMOS
magnetic permeability
amplifiers
Nonlinear distortion
disturbances
broadband
shift

Keywords

  • Broadband communication
  • Chopped operational amplifier
  • Choppers (circuits)
  • Electromagnetic interference
  • electromagnetic interference (EMI)
  • immunity
  • Nonlinear distortion
  • offset
  • robustness
  • Standards
  • susceptibility
  • Transfer functions

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

On the Robustness of CMOS-Chopped Operational Amplifiers to Conducted Electromagnetic Interferences. / Lavarda, Andrea; Petruzzi, Luca; Radez, Nejc; Deutschmann, Bernd.

In: IEEE Transactions on Electromagnetic Compatibility, Vol. 60, No. 2, 2017, p. 478-486.

Research output: Contribution to journalArticleResearchpeer-review

@article{a67fbdbecc7e4a8abd9d6c51342ce81d,
title = "On the Robustness of CMOS-Chopped Operational Amplifiers to Conducted Electromagnetic Interferences",
abstract = "This paper deals with the robustness of low power chopped CMOS operational amplifiers (OpAMPs) to electromagnetic interferences (EMI) conducted at the device input stage. The main differences between chopped amplifiers and standard offset uncompensated ones are analyzed in terms of EMI susceptibility, achieving three main results. First, a new model is developed to show how chopping influences the amplifier susceptibility in a broadband sense, demonstrating that chopped OpAMPs generate a lower amount of EMI-induced offset from the nonlinear distortion with respect to standard ones because of the topological differences between the respective input stages. Second, a model to predict the effects of EMI appearing at the multiples of the chopping frequency is derived, showing that chopped OpAMPs can experience dc shift peaks because of the linear distortion of the disturbances whose frequencies hit the even multiples of the chopping frequency. Finally, the simultaneous presence of the technological offset and the offset produced by the nonlinear and the linear distortion of EMI in chopped OpAMP is illustrated by means of dedicated EMI susceptibility measurements performed on several devices designed to validate the analysis.",
keywords = "Broadband communication, Chopped operational amplifier, Choppers (circuits), Electromagnetic interference, electromagnetic interference (EMI), immunity, Nonlinear distortion, offset, robustness, Standards, susceptibility, Transfer functions",
author = "Andrea Lavarda and Luca Petruzzi and Nejc Radez and Bernd Deutschmann",
year = "2017",
doi = "10.1109/TEMC.2017.2729781",
language = "English",
volume = "60",
pages = "478--486",
journal = "IEEE Transactions on Electromagnetic Compatibility",
issn = "0018-9375",
publisher = "Institute of Electrical and Electronics Engineers",
number = "2",

}

TY - JOUR

T1 - On the Robustness of CMOS-Chopped Operational Amplifiers to Conducted Electromagnetic Interferences

AU - Lavarda,Andrea

AU - Petruzzi,Luca

AU - Radez,Nejc

AU - Deutschmann,Bernd

PY - 2017

Y1 - 2017

N2 - This paper deals with the robustness of low power chopped CMOS operational amplifiers (OpAMPs) to electromagnetic interferences (EMI) conducted at the device input stage. The main differences between chopped amplifiers and standard offset uncompensated ones are analyzed in terms of EMI susceptibility, achieving three main results. First, a new model is developed to show how chopping influences the amplifier susceptibility in a broadband sense, demonstrating that chopped OpAMPs generate a lower amount of EMI-induced offset from the nonlinear distortion with respect to standard ones because of the topological differences between the respective input stages. Second, a model to predict the effects of EMI appearing at the multiples of the chopping frequency is derived, showing that chopped OpAMPs can experience dc shift peaks because of the linear distortion of the disturbances whose frequencies hit the even multiples of the chopping frequency. Finally, the simultaneous presence of the technological offset and the offset produced by the nonlinear and the linear distortion of EMI in chopped OpAMP is illustrated by means of dedicated EMI susceptibility measurements performed on several devices designed to validate the analysis.

AB - This paper deals with the robustness of low power chopped CMOS operational amplifiers (OpAMPs) to electromagnetic interferences (EMI) conducted at the device input stage. The main differences between chopped amplifiers and standard offset uncompensated ones are analyzed in terms of EMI susceptibility, achieving three main results. First, a new model is developed to show how chopping influences the amplifier susceptibility in a broadband sense, demonstrating that chopped OpAMPs generate a lower amount of EMI-induced offset from the nonlinear distortion with respect to standard ones because of the topological differences between the respective input stages. Second, a model to predict the effects of EMI appearing at the multiples of the chopping frequency is derived, showing that chopped OpAMPs can experience dc shift peaks because of the linear distortion of the disturbances whose frequencies hit the even multiples of the chopping frequency. Finally, the simultaneous presence of the technological offset and the offset produced by the nonlinear and the linear distortion of EMI in chopped OpAMP is illustrated by means of dedicated EMI susceptibility measurements performed on several devices designed to validate the analysis.

KW - Broadband communication

KW - Chopped operational amplifier

KW - Choppers (circuits)

KW - Electromagnetic interference

KW - electromagnetic interference (EMI)

KW - immunity

KW - Nonlinear distortion

KW - offset

KW - robustness

KW - Standards

KW - susceptibility

KW - Transfer functions

UR - http://www.scopus.com/inward/record.url?scp=85030227835&partnerID=8YFLogxK

U2 - 10.1109/TEMC.2017.2729781

DO - 10.1109/TEMC.2017.2729781

M3 - Article

VL - 60

SP - 478

EP - 486

JO - IEEE Transactions on Electromagnetic Compatibility

T2 - IEEE Transactions on Electromagnetic Compatibility

JF - IEEE Transactions on Electromagnetic Compatibility

SN - 0018-9375

IS - 2

ER -