On the Effects of Transient Electromagnetic Interference on Integrated Circuits

Bernd Deutschmann, Etienne Sicard, Sonia Ben Dhia

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)16-24
JournalElectronic device failure analysis
Volume8
Issue number4
Publication statusPublished - 2006

Fields of Expertise

  • Sonstiges

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