On different methods to combine cable information into near-field data for far-field estimation

Keong Kam, Andriy Radchenko, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Abstract

Near-field scanning is often used to solve EMC problems. Aside from the purpose of visualization of near-fields, measured near-field data can be used to estimate far-field. One of many challenges associated with using near-field to far-field transform (NFFFT) technique for EMC application is the handling of attached cables. The objective of this investigation is to evaluate different methods to add cable information to the near-field data for far-field estimation. The investigation is carried out using numerical experiments in EMCoS EMC studio, which is a commercial MoM (Method of Moment) tool for EM simulation. Measurement results from a test structure are also presented to validate the simulation results.

Original languageEnglish
Title of host publicationEMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program
Pages294-300
Number of pages7
DOIs
Publication statusPublished - 12 Dec 2012
Externally publishedYes
Event2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012 - Pittsburgh, PA, United States
Duration: 5 Aug 201210 Aug 2012

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Conference

Conference2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012
CountryUnited States
CityPittsburgh, PA
Period5/08/1210/08/12

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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    Kam, K., Radchenko, A., & Pommerenke, D. (2012). On different methods to combine cable information into near-field data for far-field estimation. In EMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program (pp. 294-300). [6351767] (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2012.6351767