TY - GEN
T1 - Numerical evaluation of Near-Field to Far-Field transformation robustness for EMC
AU - Radchenko, Andriy
AU - Zhang, Ji
AU - Kam, Keong
AU - Pommerenke, David
PY - 2012/12/12
Y1 - 2012/12/12
N2 - Near-Field (NF) to Far-Field (FF) transformation techniques are widely used for antenna radiation problems. To perform a NF to FF or a NF to NF transformation for EMC applications, the large frequency range, and a weak signals will require data in the reactive near field. In principle, the transformation can be performed if all sources are confined in the scanned area using Huygens' Principle, which requires knowledge of the exact phase and magnitude data of measured fields. In reality, this cannot be achieved, due to uncertainties in the field probe measurements, presence of active and passive cables and limited scan areas. Thus, it is attempted to perform a transformation based on an incomplete and uncertain data set. Results of a numerical simulation tool usage for NF to FF transformation based on NF-Scanning system measured data are demonstrated.
AB - Near-Field (NF) to Far-Field (FF) transformation techniques are widely used for antenna radiation problems. To perform a NF to FF or a NF to NF transformation for EMC applications, the large frequency range, and a weak signals will require data in the reactive near field. In principle, the transformation can be performed if all sources are confined in the scanned area using Huygens' Principle, which requires knowledge of the exact phase and magnitude data of measured fields. In reality, this cannot be achieved, due to uncertainties in the field probe measurements, presence of active and passive cables and limited scan areas. Thus, it is attempted to perform a transformation based on an incomplete and uncertain data set. Results of a numerical simulation tool usage for NF to FF transformation based on NF-Scanning system measured data are demonstrated.
UR - http://www.scopus.com/inward/record.url?scp=84870678789&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2012.6351692
DO - 10.1109/ISEMC.2012.6351692
M3 - Conference paper
AN - SCOPUS:84870678789
SN - 9781467320610
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 605
EP - 611
BT - EMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program
T2 - 2012 IEEE International Symposium on Electromagnetic Compatibility
Y2 - 5 August 2012 through 10 August 2012
ER -