| Original language | English |
|---|---|
| Pages (from-to) | 4950-4954 |
| Journal | CrystEngComm |
| Volume | 16 |
| DOIs | |
| Publication status | Published - 2014 |
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Experimental
- Basic - Fundamental (Grundlagenforschung)
Cite this
Ehmann, H., Kellner, T., & Werzer, O. (2014). Non – contact - mode AFM induced versus spontaneous formed phenytoin crystals: the effect of layer thickness. CrystEngComm , 16, 4950-4954. https://doi.org/10.1039/C4CE00424H
Non – contact - mode AFM induced versus spontaneous formed phenytoin crystals: the effect of layer thickness. / Ehmann, Heike; Kellner, Thomas; Werzer, Oliver.
In: CrystEngComm , Vol. 16, 2014, p. 4950-4954.Research output: Contribution to journal › Article › Research › peer-review
Ehmann, H, Kellner, T & Werzer, O 2014, 'Non – contact - mode AFM induced versus spontaneous formed phenytoin crystals: the effect of layer thickness' CrystEngComm , vol. 16, pp. 4950-4954. https://doi.org/10.1039/C4CE00424H
Ehmann H, Kellner T, Werzer O. Non – contact - mode AFM induced versus spontaneous formed phenytoin crystals: the effect of layer thickness. CrystEngComm . 2014;16:4950-4954. https://doi.org/10.1039/C4CE00424H
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AU - Ehmann, Heike
AU - Kellner, Thomas
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