Non – contact - mode AFM induced versus spontaneous formed phenytoin crystals: the effect of layer thickness

Heike Ehmann, Thomas Kellner, Oliver Werzer

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)4950-4954
JournalCrystEngComm
Volume16
DOIs
Publication statusPublished - 2014

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Experimental
  • Basic - Fundamental (Grundlagenforschung)

Cite this

Non – contact - mode AFM induced versus spontaneous formed phenytoin crystals: the effect of layer thickness. / Ehmann, Heike; Kellner, Thomas; Werzer, Oliver.

In: CrystEngComm , Vol. 16, 2014, p. 4950-4954.

Research output: Contribution to journalArticleResearchpeer-review

Ehmann, Heike ; Kellner, Thomas ; Werzer, Oliver. / Non – contact - mode AFM induced versus spontaneous formed phenytoin crystals: the effect of layer thickness. In: CrystEngComm . 2014 ; Vol. 16. pp. 4950-4954.
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