Near field probe for detecting resonances in EMC application

Jiang Xiao*, Dazhao Liu, David Pommerenke, Wei Huang, Peng Shao, Xiang Li, Jin Min, Giorgi Muchaidze

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paper

Abstract

Resonances degrade the product's EMI or immunity performance at resonance frequencies. Near field scanning techniques, like EMI scanning or susceptibility scanning determine the local behaviour, but fail to connect the local behaviour to the system level behaviour. Resonating structures form part of the coupling paths, i.e., identifying them will aid in understanding system level behaviour of products. In this article, a near field probe (patent pending) is proposed to detecting the resonances frequencies, locations or resonating structures and their Q-factors. The probe is suitable for integration into an automatic scanning system for analysing resonances of PCBs, cables, structural elements etc. The mechanism of the probe has been verified with full wave tools (CST MWS and Ansoft HESS). Two samples of application are presented.

Original languageEnglish
Title of host publication2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
Pages243-246
Number of pages4
DOIs
Publication statusPublished - 2 Aug 2010
Externally publishedYes
Event2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 - Beijing, China
Duration: 12 Apr 201016 Apr 2010

Publication series

Name2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

Conference

Conference2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
CountryChina
CityBeijing
Period12/04/1016/04/10

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Near field probe for detecting resonances in EMC application'. Together they form a unique fingerprint.

Cite this